2021 Volume 63 Issue 2 Pages 89-96
Recent marked development called “Resolution revolution” has made cryo-electron microscopy （Cryo-EM） the third method of structure determination at atomic resolution next to X-ray crystallography and NMR. In this review, actual situation surrounding Cryo-EM including an outline about the workflow from sample preparation to image analysis and differences between Cryo-EM analysis and X-ray crystallography is introduced. We hope that this review is useful for researchers particularly who will start Cryo-EM analysis.
