Nihon Kessho Gakkaishi
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
Plane-Polarized X-Ray Sources
Shoichi ANNAKATadasu SUZUKI
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JOURNAL FREE ACCESS

1979 Volume 21 Issue 5 Pages 301-304

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Abstract
Bragg reflections with≅45° Bragg angle, Laue-case diffraction from thick perfect crystals and synchrotron X-radiation are now utilized as plane-polarized X-ray sources. The characteristics of these sources are surveyed putting stress on the monochromator systems for the synchrotron radiation.
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© The Crystallographic Society of Japan
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