Nihon Kessho Gakkaishi
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
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Volume 21, Issue 5
Displaying 1-6 of 6 articles from this issue
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  • [title in Japanese]
    [in Japanese]
    1979 Volume 21 Issue 5 Pages 281
    Published: September 30, 1979
    Released on J-STAGE: September 30, 2010
    DOIhttps://doi.org/10.5940/jcrsj.21.281
    JOURNAL FREE ACCESS
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  • X-Ray Small Angle Scattering in Polymer Solutions
    Yoshinobu IZUMI, Yasuhiro MIYAKE
    1979 Volume 21 Issue 5 Pages 282-300
    Published: September 30, 1979
    Released on J-STAGE: September 30, 2010
    DOIhttps://doi.org/10.5940/jcrsj.21.282
    JOURNAL FREE ACCESS
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    The recent developments of data analysis of the x-ray small-angle scattering technique have been presented with some applications to polymer solutions.
    First the weighting functions of a general slit collimation correction system have been described according to Hendricks and Schmidt and applied to the evaluation of the weighting functions of the U-slit camera manufactured by Rigaku Denki Co. Ltd., where the good agreement between the calculation and the direct measurement has been obtained. Second the comparison of some smoothing and collimation correction programs for different types of x-ray small-angle scattering curves has been made. Absolute intensity measurement technique has been described in general fashion according to Hendricks and applied to some of the direct and indirect measurements.
    Finally the typical applications of x-ray and neutron small-angle scatterings are resented including those related to 1) linear chain molecule in dilute and concentrated solutions, 2) biological macromolecules, and 3) copolymer.
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  • Plane-Polarized X-Ray Sources
    Shoichi ANNAKA, Tadasu SUZUKI
    1979 Volume 21 Issue 5 Pages 301-304
    Published: September 30, 1979
    Released on J-STAGE: September 30, 2010
    DOIhttps://doi.org/10.5940/jcrsj.21.301
    JOURNAL FREE ACCESS
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    Bragg reflections with≅45° Bragg angle, Laue-case diffraction from thick perfect crystals and synchrotron X-radiation are now utilized as plane-polarized X-ray sources. The characteristics of these sources are surveyed putting stress on the monochromator systems for the synchrotron radiation.
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  • Spin Polarized Electron Beam Sources
    Hiroshi TANAKA, Tadasu SUZUKI
    1979 Volume 21 Issue 5 Pages 305-313
    Published: September 30, 1979
    Released on J-STAGE: September 30, 2010
    DOIhttps://doi.org/10.5940/jcrsj.21.305
    JOURNAL FREE ACCESS
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    Methods of the production of spin polarized electron beams ; Mott scattering, photoionization (Fano effect), LEED and photoemission are described.
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  • [title in Japanese]
    [in Japanese]
    1979 Volume 21 Issue 5 Pages 314-316
    Published: September 30, 1979
    Released on J-STAGE: September 30, 2010
    DOIhttps://doi.org/10.5940/jcrsj.21.314
    JOURNAL FREE ACCESS
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  • [title in Japanese]
    [in Japanese]
    1979 Volume 21 Issue 5 Pages 316-321
    Published: September 30, 1979
    Released on J-STAGE: September 30, 2010
    DOIhttps://doi.org/10.5940/jcrsj.21.316
    JOURNAL FREE ACCESS
    Download PDF (758K)
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