セラミックスの粒界と組成
1982 年 24 巻 4 号 p. 206-216
詳細
1982 年 24 巻 4 号 p. 206-216
The recent applications of a conventional transmission electron microscope (TEM) and an analytical electron microscope (AEM) to studying ceramic grain boundaries are reviewed. Dislocation structures at small angle grain boundaries and the difficulty in observing general high angle grain boundaries with TEM are presented by using examples of micrographs observed. Elemental analysis data of Sialon and phase separated glass with AEM are also described.
