Abstract
A general survey of the methods developed so far in making measurements of X-ray diffuse scattering from a single crystal is given. As a new technique, the method with a combination of an energy-dispersive detector and source of white X-ray radiation (Harada et al.: J. Appl. Cryst. 17, 1 (1984) ) is described in detail and the advantages and disadvantages of the method are discussed.
