Abstract
The X-ray standing wave method, which has been applied to the determination of the atomic structure of the crystal surface and interface, is reviewed. Firstly some topics on the determination of the position of surface adsorbates by this method are summarized. Secondly the studies on the determination of the atomic structure of the interface between an epitaxial film and a substrate crystal, which have been investigated by the present authors, are reported. [J. Cryst. Soc. Jpn. 26, 228 (1984) ] .
