Nihon Kessho Gakkaishi
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
Microstuctural Analysis of Grain Boundaries in Electronic Ceramics
Masayuki FUJIMOTO
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1985 Volume 27 Issue 4 Pages 261-269

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Abstract
The microstructure of strontium titanate internal boundary layer capacitors at various stages in their processing was characterized in detail using high resolution transmission electron microscopy. Freezed equilibrium phase at high temperature in rapidly quenched samples and the structural changes during cooling process were revealed.
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© The Crystallographic Society of Japan
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