電子材料セラミクスにおける粒界の微細構造
1985 年 27 巻 4 号 p. 261-269
詳細
1985 年 27 巻 4 号 p. 261-269
The microstructure of strontium titanate internal boundary layer capacitors at various stages in their processing was characterized in detail using high resolution transmission electron microscopy. Freezed equilibrium phase at high temperature in rapidly quenched samples and the structural changes during cooling process were revealed.
