日本結晶学会誌
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
微小単結晶を利用した無消衰条件下における精密構造解析
石沢 伸夫
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ジャーナル フリー

2000 年 42 巻 2 号 p. 155-159

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Single crystal X-ray diffraction studies under virtually extinction-free conditions have been carried out using 10-micrometer-sized small crystals and the synchrotron radiation at the beamline 14A, Photon Factory, KEK. A case study for CaYAIO4 is described. Results were compared with those obtained by the conventional rotating-anode four-circle diffractometer using Ag Kα. It' was revealed that the extinction-correction included in the least-squares procedure sometimes causes serious artefacts in the deformation density maps and may lead to incorrect interpretation. Collection of virtually extinction-free diffraction data is indispensable for precise structure analyses to elucidate structures containing a lesser degree of disorder, as well as for charge density analyses.

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