A model peak profile function synthesized by multiple convolutions of the intrinsic peak profile with the instrumental functions of a conventional powder X-ray diffractometer has been developed. The general recipe for deriving accurate instrumental functions as well as an efficient numerical method for evaluating the convolutions are presented. The validity of the model function has been examined by comparing the experimental peak profiles measured in different conditions. The use of the convoluted model profile function provides a convenient and reliable way to estimate the integrated intensities, intrinsic peak positions and broadenings.