2002 年 44 巻 2 号 p. 104-113
Synchrotron X-ray diffraction and scattering techniques were applied for the determination of the valence state and the detection of charge ordering in transition-metal oxides. This article includes the following topics of difference Fourier syntheses, X-ray anomalous scattering, the extraction of K-shell electrons, Fourier integration, valence-difference contrast, X-ray magnetic circular dichroism and resonant X-ray magnetic scattering.