Estimation of Absolute Spectral Sensitivity of a Silicon Photodiode

Abstract

This paper is concerned with measuring method of the absolute spectral sensitivity of photodiodes. This is generally made possible with simple equipment by the self-calibration method of quantum efficiency published rece ntly by J. Geist, et al with NBS. Applying this method to photodiodes on the market, several practical problems were investigated.
A mutual comparative method suitable for the measurement of surface reflectance of photodiodes was introduced, and the relation between incident angle and quantum efficiency was studied.