抄録
In order to control orientation distributions or texture in polycrystalline materials, it is important to study microstructural evolution, such as recrystallization and grain growth. In this study, microstructures have been observed in detail by using the SEM/EBSP orientation analyzing system before and after annealing during grain growth in an aluminum foil for electrolytic capacitor. The foil sample after the first annealing had a columnar structure with a few R-orientation grains in a cube texture. It was found that some grains disappeared after the second annealing. We carried out Monte Carlo simulation of grain growth in the Potts model applying orientations image data before the second annealing to an initial microstructure to predict microstructural evolution. Dependence of grain-boundary energy on misorientation was given on the basis of previous experimental knowledge in the simulation model. The simulation reproduced migrations in high angle grain-boundaries with disappearing of R-orientation grains and stable topological features in low angle grain-boundaries.
