Journal of Japan Industrial Management Association
Online ISSN : 2432-9983
Print ISSN : 0386-4812
Sampling Inspection Plans for the Minimum Value of Two-Parameters Exponential Distribution
Akira KOUDAShozho TAKEYAMA
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1989 Volume 39 Issue 6 Pages 391-397

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Abstract
It is supposed that the lot quality is evaluated by the minimum value in the lot and the quality characteristic is distributed by exponential distribution with location and scale parameters. Both cases where scale parameter is known and unknown are considered. In unknown scale parameter case, the scale parameter is estimated from the first stage sample, and the total size of sample is determined on the basis of that estimate. Then the total sample size and also the OC function are random variables. Utilizing this prperty of OC function, three types of two stage sampling inspection plans are constructed by Expectation Method, Probability Method and Median Method.
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© 1989 Japan Industrial Management Association
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