Abstract
Microstructures and magnetic domain structures of isotropic and anisotropic Sm-Fe-N bonded magnets were investigated by transmission electron microscopy and electron holography, respectively. In addition to mechanical polishing, ion-milling and focused ion beam methods were utilized to prepare thin specimens for transmission electron microscopy. With these thin specimens, the sizes of particles in anisotropic and isotropic bonded magnets were estimated, and also magnetization distributions in these particles were clarified. Furthermore, by changing the direction of the incident electron beam against a thin specimen, a pair of holograms were observed to separate the electric and magnetic fields. Thus, detailed magnetization distribution in Sm-Fe-N was clarified at the specimen edge.
