Journal of the Japan Institute of Metals and Materials
Online ISSN : 1880-6880
Print ISSN : 0021-4876
ISSN-L : 0021-4876
Regular Article
Evaluation of Elastic Deformation Behavior of ARB Processed Ultrafine Grained Ni Polycrystalline Material by X-ray Diffraction
Nobuhito TakamasuTomotaka MiyazawaYoji MiyajimaHiroki AdachiSusumu Onaka
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2019 Volume 83 Issue 5 Pages 157-165

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Abstract

Ni polycrystals were processed by accumulative roll-bonding (ARB) of 7 cycles and tensile specimens were cut from the ultra-fine grained (UFG) Ni after ARB. Microstructure and crystallographic orientation of UFG Ni were observed by scanning electron microscopy (SEM) and electron back scattering diffraction (EBSD) method. Three textures component, Copper, Brass and S orientations were found in UFG Ni.

Three specimens for tensile tests having tensile directions parallel with RD, TD and 45D were cut from UFG Ni. RD and TD indicate rolling and transverse directions of ARB process respectively, and 45D indicates a 45 degree direction between RD and TD. For these specimens, in-situ XRD measurements were performed during tensile deformation. Elastic strains during tensile deformation were calculated from values of peak shift for various diffraction planes obtained by the XRD measurements. For RD specimen, the elastic strains during initial deformation for various diffraction planes were almost the same. However, for 45D specimen, the elastic strains for various diffraction planes were different even at initial loading. TD specimen showed behavior like RD specimen. The difference in the elastic behavior between the specimens are discussed by considering difference in crystallographic directions of grains along tensile directions in the specimens which is caused by the textures generated after ARB.

Fig. 5 The relationship between the elastic strain εr calculated from the results of XRD measurements and the nominal stress σ during the tensile deformation under the constant cross-head speed for (a)RD, (b)TD and (c)45D specimens. The results of various diffraction planes are indicated. Black solid and dotted lines indicate linear relationships between εr and σ for the maximum and minimum Young's moduli of Ni single crystals. Details of Young' s moduli of Ni single crystals are discussed in 4.3.1. Fullsize Image
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© 2019 The Japan Institute of Metals and Materials
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