A New Method for X-ray Diffraction by Oscillation Technique

Abstract

A new oscillation apparatus has been developed for X-ray diffraction technique. The apparatus is composed of two parts. The one is rotating the specimen around the surface normal, and the other is oscillating it as wide as possible around an oscillation axis.
The use of the apparatus allowed the accurate determination of the materials having coarse grained crystals or textured grains: the maximum grain size adaptable for the present method (oscillating angle, ±30°) was estimated, and found to be about seventeen times (∼850 μm in size) as large as the case without the oscillation.