Abstract
Using the transmission electron microscope, the growth morphology, orientation relationships and interface structure have been investigated for TiC and TiN films deposited on WC-Co alloys by chemical or physical vapor deposition (CVD or PVD). CVD-TiC films on the WC-Co alloys were grown in granular form and their interfaces were irregular. The TiC/WC orientation relationship was given as (0001)WC\varparallel(1\bar11)TiC and [\bar1100]WC\varparallel[\bar112]TiC. PVD-TiN films on WC-Co alloy were grown in columnar form. TiN grains showed particular orientation relationships with WC grains. One of the relationships was the same as that observed for TiC/WC, and the other was [0001]WC\varparallel[1\bar10]TiN, (10\bar10)WC\varparallel(111)TiN. CVD-TiN films on the WC-Co alloys showed the change in growth morphology from the granual form at the initial stage of growth to the columnar form.
