Abstract
To investigate the structure of binary silicate in the composition range MeO/SiO2>1, O1s spectra in MeO (MeO=CaO, ZnO)-SiO2 glasses were measured by means of X-ray Photoelectron Spectroscopy (XPS) and quantitative analysis for the existence ratios of silicate anions was carried out by the Trimethylsilylation (TMS) method.
The results were summarized as follows:
(1) The measured O1s XPS spectra were fitted precisely by the curve fitting method using the following function with α=0.75. The analyzed value of the oxygen ions (i.e. O0, O−, O2−) in crystalline silicate were in good agreement with the theoretical existence ratios of the oxygen ions.
(This article is not displayable. Please see full text pdf.)
(2) Equilibrium constants K for the chemical reaction 2O−=O\hat0+O\hat2− in binary silicate, calculated from the analysis of O1s spectra, were 0.0013 in the CaO system and 0.037 in the ZnO system, respectively.
(3) Polysilicate anions in the composition range of 66.7 to 60 mol% ZnO showed the average polymerization degree of nO0⁄nSi=1.