Journal of the Japan Institute of Metals and Materials
Online ISSN : 1880-6880
Print ISSN : 0021-4876
ISSN-L : 0021-4876
Discussion on Measuring Method of Hall Constant of Thin Films of Semiconducting Oxides
Li-Wei Zhang, Kazuhiro Silvester Goto
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Keywords: Hall constant, thin films, semiconducting oxides
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1989 Volume 53 Issue 8 Pages 836-837

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