Journal of the Japan Institute of Metals and Materials
Online ISSN : 1880-6880
Print ISSN : 0021-4876
ISSN-L : 0021-4876
Transmission Electron Microscopy of Joints between the Sn-Ag Solder and the Electroless Ni-P of an Electronic Device
Naoki TorazawaShigeo AraiKoji ShimoyamaYoshihisa TakaseHiroyasu Saka
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2002 Volume 66 Issue 2 Pages 47-52

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Abstract
Microstructure of Pb-free Sn-Ag solder and joints between the Pb-free solders and electroless Ni-P was examined by means of transmission electron microscopy. Microstructures of the solders consist of β-Sn matrix dispersed with Ag3Sn particles. Analysis of the diffraction patterns shows that there are more than one orientation relationships between β-Sn and Ag3Sn. The solder joint of the Pb-free solders is essentially similar to the joint of Pb-Sn eutectic solders. Analysis of distribution of the elements by EDX analysis shows that Ag does not diffuse into Ni-P. Both of the as-deposited Ni-P and P-enriched Ni, the latter being formed as a result of reaction with Sn-Ag solder, have FCC structures based on pure Ni. In other words, P is dissolved in Ni to form a solid solution.
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