Journal of the Japanese Association for Crystal Growth
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
Stability of thin CuX film on Cu Microcrystals.
K. KishiR. DoumotoD. Komiyama
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JOURNAL FREE ACCESS

1998 Volume 25 Issue 3 Pages A98-

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Abstract
Stability of thin halide films observed on the surface of Cu microcrystals is studied by using molecular dynamics (MID) method. According to the AFM observations, thin {111}α-Cul film freezes epitaxially from the melt at 923K, 67K above the melting point, on Cu {110}, suggesting that the presence of the film forms {110} and blocks the formation of {111} surfaces on Cu.
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© 1998 The Japanese Association for Crystal Growth
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