Journal of the Japanese Association for Crystal Growth
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
Lateral Wet Oxidation of AlAS Layer Grown on High Index GaAs Substrate by MBE
K. KohnoA. MiyagawaJ. T. NelsonT. Ohachi
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2000 Volume 27 Issue 1 Pages 37-

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Abstract

The oxidation of AlAs was found to depend on its layer thickness. Our experiments showed that if the AlAS layer thickness was more than 100 nm, the oxidation followed a I -dimensional model, but if the thickness was from 10 to 100 nm, the characteristics didn't follow the model. The composition of Al_xGa_<1-x> As also affected the oxidation: a larger had faster oxide growth. If x exceeded 0.75, the oxide grew rapidly, but when x was between 0.45 and 0.75, there was little growth of the oxide.

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© 2000 The Japanese Association for Crystal Growth
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