ひげ結晶の成長と成長機構

抄録

Except in particular cases a negative view of the whisker growth due to axial screw dislocation prevails on the basis that its verifications are few. Judging from observations of the Te-whisker growth process and the growth conditions and configuration of whiskers in which axial dislocation is recognized, however, the posibility of a dislocation slipping out of whiskers by thermal agitation can be speculated. Meanwhile theoretical studies on whisker due to VLS mechanism, though several theories about its rate-determining process have been reported, seem to be beginning. As compared with the initial Si-whisker due to VLS mechanism, the recent studies are expanding into a considerably anomalous area through diversification of kinds and methods. Stimulated by this fact, reports of research of whisker growth under the effect of an unknown impurity are steadily increasing. Thus the recent trend indicates that a new growth mechanism under the effect of impurity is gradually establised.