Japanese Journal of Radiological Technology
Online ISSN : 1881-4883
Print ISSN : 0369-4305
ISSN-L : 0369-4305
GEOMETRICAL INTERPRETATION OF SPURIOUS RESOLUTION BY X-RAY
KOICHI TAKAHASHI
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JOURNAL FREE ACCESS

1967 Volume 23 Issue 3 Pages 252-259

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Abstract
In order to oftain a numerical value of resolving power, the parallel-line type or Siemens star test chart has probably been employed the most extensively. When these test charts use, spurious resoltion is observed. I explaine the reason of this spurious resolution by geometrical method.
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© 1967 Japanese Society of Radiological Technology
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