A simpler method to evaluate electromagnetic shielding performance at X-band has been required to develop new types of windows for civil and defense aircraft. In this study, we propose a new simple measurement method using a tiny piece of specimen for evaluating the characteristics of PMMA (Polymethyl methacrylate) plate coated ITO (Indium Tin Oxide) layer with different surface electric resistivity. The surface electric resistivity of each specimen is about 10[Ω/sq.], 30[Ω/sq.], 40[Ω/sq.], respectively. The experimental results were compared with a conventional method and proposed method. The maximum electromagnetic shielding value for 10[Ω/sq.] of the specimen reached 30[dB]. These results obtained by proposed method are consistent with the conventional measurement method and analysis results. Therefore, it was confirmed that the our proposed method is effective as an evaluation method of an electromagnetic wave shielding material using a thin film.
