抄録
Shape measurement is required in factory automation. An exemplary application is bin-picking. As one type of a contactless measurement method, phase-shifting methods in which a grating pattern is projected are known. A compact, lightweight device is required for projecting the grating pattern inside production equipment. As a compact, lightweight projector, a MEMS (Micro Electro Mechanical Systems) scanner grating projector is proposed. However, the projected pitch is not uniform in whole projected area because the pitch is changed according to the angle of the 1D MEMS scanner. Calibration is therefore important. We have developed a shape measurement system using the whole-space tabulation method (WSTM) with the MEMS scanner grating projector. The influence of the change of the projected grating pitch is eliminated with the WSTM. In this paper, the shape measurement system was applied to bin-picking with a robot hand and its effectiveness was confirmed.
