抄録
The present work reports surface segregation in polycrystalline yttria-stabilized zirconia (cubic) including 10 mol% Y2O3 (10YSZ). The 10YSZ specimen was annealed in the range 1073 K - 1673 K in the gas phase of controlled oxygen activity. The segregation-induced intensity profiles of 89Y, 28Si, and 90Zr were measured using secondary ion mass spectrometry (SIMS). The data obtained show that (i) annealing of 10YSZ results in the formation of segregationinduced concentration gradients of 89Y, 28Si, and (ii) segregation-induced profiles depend on oxygen activity.
