Phase Transition of BiFe_1-xAl_xO₃ Films Prepared by Chemical Solution Deposition

抄録

BiFe_1-xAl_xO₃ thin films with rhombohedral (R3c), monoclinic (Cm) and tetragonal (T)-like symmetry were obtained by the chemical solution deposition (CSD) and rapid thermal annealing (RTA). The T-like phase is formed under high temperature and high Al concentration. While the Cm phase is stable in the region of low temperature and high Al concentration. The phase transition is suggested to be arisen from strain induced in the film formation.