Ni内部電極積層セラミックコンデンサの信頼性に及ぼすSiO₂の影響

抄録

Degradation behavior of insulation resistance of BaTiO₃ based Ni-electrode multilayer ceramic capacitors has been studied with special reference to the dielectric composition and grain boundary chemistry. The degradation behavior shows clear dependence on A/B of grain boundary layer. It is shown that SiO₂ extracts BaO and Cat) from (Ba₁-_XCa_XO)_m(Ti₁-_YZr_YO₂) and then A/B of grain boundary layer become less than the unity. We have developed high capaci-tance multilayer ceramic capacitors as 10.5μF in 3216 type with superior reliability, using newly developed dielectric material, (BaO)_m(Ti₁-_YZr_YO₂)+aMnO+bY₂O₃+cV₂O₅+dWO₃ (Y=0.18, m=1.004, a=0.2wt%, b=0.3wt%, c=0.04wt%, d=0.05wt%).