Abstract
Effect of chemical composition on aging behavior of X7R multilayer ceramic chip capacitors (MLCCs) with Ni-electrode was studied with reference to the microstructure. It has been shown that the aging behavior under DC field has a strong relation with Mn0 and Y203-contents in dielectric material, tetragonality, and microstructure. After aging test, residual polarization existed, resulting in the degradation of specific dielectric constant. High capacitance MLCCs with superior properties have been developed by employing the dielectric material composed of BaTiO3-MgO-Mn0-Y2O3-Ba0.6Ca0.4SiO3.
