抄録
The improvement of image quality has a close relation with lighting and lens in an automatic inspection system. The quality of image could affect the cost, speed and stability of an inspection system. The influences of the lighting configuration and the spherical aberration of lens in an automatic inspection system are studied by means of Monte Carlo (MC) method in this paper. The theoretical analysis and simulation results reveal as follows: when the light source deviates from the center of the inspection system, the planar light source with a large (small) inclination has a better illumination in the near (far) distance within a narrow (broad) scope. The illumination scope becomes broader as the sloped light source deviates from the center of the inspection system. There exist some symmetric distortions in the margin of the pattern while the spherical aberration presents. This research not only supplies an available method for the analysis of lighting configuration but also points out a new way for analyzing the aberration of lens.
