A Sendust MIG head was constructed with oxide or noble metal layer being deposited at the interface between Sendust film and ferrite. An A.E.S. study indicated that the deposition of barrier films such as Ir, Pt or SiO2 prevented the thermal diffusion of oxygen and hence the oxidation of Sendust film at the interface. Intensity of X.R.D. peak from (110) Sendust initial layers deposited on the barrier film/ MnZn-ferrite were larger than that from the one directly deposited on MnZn-ferrite. Thus the MIG head constructed with Ir or SiO2 film being placed between Sendust film and MnZn-ferrite showed successfully reduced secondary gap effect.