1991 年 15 巻 S_1_MORIS_91 号 p. S1_357-360
Advancements in the manufacture of Magneto-optic (M-O) media have led to the production of environmentally stable constructions. As the life expectancy of the media has increased, so has the need for more refined analysis techniques to estimate its reliability. A conventional Arrhenius model was examined for fit with actual media stability data. The time to failure was estimated by projecting Byte Error Rate (BER) increase as a function of time at various temperatures and 85% relative humidity. Assuming that actual failure may occur earlier due to other causes, a Weibull model is proposed as a more realistic model of current media. Hypothetical data is fitted to this model for illustration.
