1994 年 18 巻 S_1_PMRC_94_1 号 p. S1_475-478
Overwrite characteristics are discussed from the non-linear transition shift viewpoint The transition shift during write process, caused by the interference of the pre-recorded magnetization, was measured. Based on the transition shift, a model of the overwrite phenomenon was presented. Its validity was demostrated through the experiments. In particular, overwrite dependence on recording density were explained with the model. It was also confirmed that a bi-layered single pole head could improve the overwrite performance by suppressing the transition shift.