抄録
The recrystallization process in Fe51.2Rh48.8 thin films was studied to clarify the relationship between the film microstructure and the magnetic transition. It was found that high-temperature annealing results in grain growth and a plate-like structure. The transition temperature and the thermal hysteresis width decrease from 70 to 10°C and from 140 to 3°C, respectively, as the annealing temperature increases from 600 to 1200°C. The film annealed at 1200°C exhibits complete ferromagnetic-to-antiferromagnetic transition as bulk FeRh alloy does. The thin plate-like structure and the lattice distortion strongly affect the thermal hysteresis. It was found that the stress release mechanism is closely related to the thin plate martensitic transformation.
