MFM OBSERVATIONS OF NANOSCALE MARKS WRITTEN BY SIL NEAR FIELD RECORDING

抄録

  Magnetooptic recordings using the Near-Field Solid Immersion Lens (SIL) technique are analyzed by Magnetic Force Microscopy (MFM). The marks are found to be very regular and have sharp edges which is essentially important for mark-edge recordng. It is possible to measure both CNR and jitter from the MFM images of the high density, submicron size recordings. Due to high resolution of MFM these parameters represent potential recording properties. The CNR, jitter and qualitative analysis show that the smallest mark-to-mark spacing useful for recording is ∼120% of the isolated mark size. For the smallest marks this translates into a density larger than 2×10⁹ marks/inch². Results obtained show that the MFM can be used as a high resolution read-out technique for high density magnetooptic recordings.