抄録
Sputter-deposition at high Ar pressures was investigated with the aim of reducing the medium noise of Co/Pd multilayer films for perpendicular magnetic recording media. A large increase in perpendicular coercivity was obtained in samples prepared at Ar pressures above 10 Pa. Angular variations of the coer civity suggested that the magnetization reversal process was dominated by domain wall motion in the samples prepared at Ar pressures below 5 Pa, while it seemed rotational in samples prepared at Ar pressures above 10 Pa. Through recording performance tests with a ring head, it was found that a sample prepared at a high Ar pressure of 70Pa showed a lower medium noise level and higher recording resolution than a sample prepared at 1 Pa.
