1998 年 22 巻 4_2 号 p. 401-404
The magnetic and electrical properties of two-dimensional epitaxial a-axis Lan-nxCa1+nxMnnO3n+1 (n=2, 3; x=0.3) films and three-dimensional La1-xCaxMnO3 (x=0.3) film were studied. Various systematic changes in the properties were observed as n (the number of MnO2 layers) was reduced. These included a decrease in the resistivity peak temperature (Tρmax), and enhancement of the magnetoresistance near Tρmax and the characteristic low-temperature magnetoresistance whose field dependence has a hysteresis curve. It is concluded that the changes result from a decrease of the transfer (tcij) along the c-axis of the crystal and the effect of spin fluctuation between MnO2 layers.