抄録
The chipsize dependence of the magnetic characteristics of thin-film reactors using nanocrystalline Fe (Co-Fe)-Hf-O magnetic films with a high resistivity is discussed by using the finite element method in which a linear magnetization of the thin-film is asssumed. The inductance of the reactors is proportional to the 3rd power of the reactor-size W. The loss-equivalent resistances of the film and the coil-conductor are proportional to the 4th and 2nd powers of W, respectively. The iron loss of the reactors is very small, and show a high value of the quality factor at a high frequency region.
