Application of a Retarding-type Mott Analyzer to Observation of Magnetic Domains

Abstract

We developed a retarding-type Mott analyzer, of which the figure of merit and the size were improved as compared with our previously designed analyzers. The figure of merit of the new analyzer is sufficient to be used in a spin-polarized secondary electron microscope (SP-SEM) system. Equipping a UHV-SEM system with the analyzer and a secondary electron collector, we constructed an SP-SEM system. The proper operation of the system was confirmed by observing a single Fe crystal and we got clear images of domain structures on the Fe (001) surface. We also got a magnetic domain image of a patterned permalloy thin film.