Spin Resolved SXAPS for Ni

J. Fujii; Y. Suzuki; T. Mizoguchi

doi:10.3379/jmsjmag.23.730

Journal of the Magnetics Society of Japan

Online ISSN : 1880-4004
Print ISSN : 0285-0192
ISSN-L : 0285-0192

Chapter 10. Novel Scientific Instrumentation & Processing

Spin Resolved SXAPS for Ni

J. Fujii, Y. Suzuki, T. Mizoguchi

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Keywords: soft x-ray, appearance potential spectroscopy, Ni 2p core electron, spin polarized electrons

JOURNAL OPEN ACCESS

1999 Volume 23 Issue 1_2 Pages 730-732

DOI https://doi.org/10.3379/jmsjmag.23.730

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Abstract

The soft x-ray emission intensity from Ni(110) surface was measured by appearance potential spectroscopy with spin polarized electrons near 2p electron threshold energy. The pulse count measurements of x-ray intensity instead of ordinary SXAPS measurements with lock-in technique made it possible to obtain knowledge of effects not only the characteristic x-ray but bremsstrahlung x-ray on spectra. The spectra reveal the invalidty of ordinary APS theory based on one electron approximation for Ni.

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