媒体磁化を考慮した記録ビットシフトモデル

抄録

The estimation of error rates is becoming increasingly important with the continued growth in the density of magnetic recording. It is known that the error rate is strongly affected by the overwrite performance, while it strictly depends on the bit shift caused by hard-transition shift (HTS) or non-linear transition shift (NLTS). We designed a bit-shift model based on the mechanism of bit-shift occurrence. Our model confirms that the overwrite depends on the overwritten transition density and can be characterized by HTS and NLTS. This paper discusses simulations of the dependencies of the write gap length, the write field, and the spacing on overwrite.