抄録
Thin films of ordered double perovskite Sr2FeMoO6 were sputter-deposited on Ba0.4Sr0.6TiO3-buffered SrTiO3 substrates, and their surface properties were examined by atomic force microscopy (AFM) and X-ray photoemission spectroscopy (XPS). The Mo 3d spectra of Sr2FeMoO6 films showed a multiple peak structure, which originated from the unusual electronic state of metallic Sr2FeMoO6. Systematic XPS studies of the air-exposed surface of Sr2FeMoO6 film indicated that the surface native barrier was an insulating SrMoO4. In addition, a TMR junction with the native barrier was fabricated using a convention photolithographic technique, and an MR ratio of 10 % was observed at 4.2 K.
