XPS analysis on high Curie temperature Sr₂CrReO₆ thin films

Abstract

With high quality thin films of the double perovskite Sr₂CrReO₆, we have investigated an electronic state of the surface of the Sr₂CrReO₆ thin film and the interface of bi-layer Sr₂CrReO₆ / MgO or SrTiO₃ film by X-ray photoemission spectroscopy (XPS). The Re 4f spectrum of Sr₂CrReO₆ has shown a multiple peak structure, which originates from the inherent electronic state of Re in half-metallic Sr₂CrReO₆. Moreover, it has been found that the electronic state in Sr₂CrReO₆ is preserved at the Sr₂CrReO₆ / MgO interface.