電子線ホログラフィー法による強磁性薄膜の磁区観察

抄録

Electron holography has recently made a remarkable progress due to the high coherence of an electron beam generated in a field emission electron microscope and almost reached the stage of practical reality.
Holographic interference electron microscopy was realized which gives information on magnetization distribution of specimen. Interference fringes in a contour map were proved to be along the in-plane magnetic lines of force when the thickness was uniform and the magnetic field was closed in the specimen.