2015 Volume 8 Issue 2 Pages 71-78
Titanium dioxide dust was analyzed using a hand-held X-ray fluorescence analyzer (HHXRF). Titanium dioxide powders were suspended in 1-butanol, and the suspended solutions were filtered through membranes. The titanium masses on the membrane filters were measured using XRF through the conventional procedure and our newly proposed procedure. In the new method, the membrane filter samples were shifted to a copper plate and analyzed using an HHXRF analyzer designed for metal alloys. Titanium was regarded as an impurity in the copper plate, and the HHXRF device used the fundamental parameter (FP) program for the analysis. The values obtained through this method were nearly equal to those obtained by the benchtop X-ray fluorescence analyzer. There were some differences between the values obtained for the PVC membrane filter sample and PTFE membrane filter sample. However, the measured values were independent of the crystal structures and the primary sizes of the titanium dioxide powders. According to our proposed method, 25 µg of titanium was found in the filter sample. Our results indicate that a sampling period of only 33 min is sufficient to assess whether the airborne concentration of nano titanium dioxide is above its recommended OEL (0.3 mg/m3); and therefore, this method is effective as a screening technique for nano titanium dioxide.