Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2189-0803
ISSN-L : 2189-0803
55.2.4
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observation of SiC/SiO_2 interface states by means of X-ray photoelectron spectroscopy measurements under bias
T. Sakurai, Vasconcelos E. de, T. Katsube, Y. Nishioka, H. Kobayashi
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Pages 753-

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© 2000 The Physical Society of Japan
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Meeting Abstracts of the Physical Society of Japan

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