HREM direct observation of a SiO_2/Si interfacial structure

Meeting Abstracts of the Physical Society of Japan

Online ISSN : 2189-0803
ISSN-L : 2189-0803

55.2.4

DOI https://doi.org/10.11316/jpsgaiyo.55.2.4.0_753_2

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HREM direct observation of a SiO_2/Si interfacial structure

N. Ikarashi, Y. Miyamoto, K. Watanabe

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Pages 753-

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© 2000 The Physical Society of Japan

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