Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2189-0803
ISSN-L : 2189-0803
74.1
Session ID : 17aE201-11
Conference information

2019 Annual (74th) Meeting of the Physical Society of Japan
Electrical resistivity measurements for dislocations in micrometer-sized Bi-Sb topological insulators 2
Hiromu HamasakiYuki TokumotoKeiichi Edagawa
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Article 1st page
Content from these authors
© 2019 The Physical Society of Japan
Previous article Next article
feedback
Top